利用酸辅助一锅法合成了形貌均一的三氧化钨方形纳米片。通过扫描电子显微镜(SEM)、透射电子显微镜(TEM)和紫外漫反射吸收光谱(UV-DRS)对材料的形貌结构和均一性进行表征。由X射线光电子能谱分析(XPS)与X射线衍射(XRD)对材料中的元素和价态表征可知, 成功制备了三氧化钨纳米片, 并发现其表面具有一定的氧缺陷。将该材料作为表面增强拉曼散射(Surface-enhanced Raman scattering, SERS)基底, 对不同浓度结晶紫(CV)进行了检测, 并经统计计算得到了917 cm-1处特征峰的相对标准偏差(RSD)值为16.13 %, 表明该基底具有较高的重复性。

Tungsten trioxide square nanosheets were prepared via acid-assisted one-pot process. Morphology structure and homogeneity of the materials were characterized by scanning electron microscope (SEM), transmission electron microscope (TEM) and ultraviolet-visible diffuse reflection spectrum (UV-DRS). According to the X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis of the elements and states in the material, the tungsten trioxide nanosheets were successfully prepared and some oxygen defects were found on the surface. Using this material as the surface-enhanced Raman scattering (SERS) substrate, different concentrations of crystal violet (CV) was detected, and the relative standard deviation (RSD) value of 917 cm-1characteristic peak was 16.13%, indicating that the substrate had high repeatability.