激光与光电子学进展, 2019, 56 (12): 120101, 网络出版: 2019-06-13   

CAPIS技术探测波前畸变的实验研究 下载: 1161次

Experimental Study onWavefront Distortion Detection Using CAPIS Technology
作者单位
西安理工大学自动化与信息工程学院, 陕西 西安 710048
摘要
计算光场自适应光学成像(CAPIS)技术能够同时记录信号的位置和方向,从光场信息中可得到畸变波前斜率,从而重构波前。研究了CAPIS技术探测光学波前畸变,给出了数值计算模型并进行了仿真分析。结果表明,CAPIS技术可准确地探测低阶像差波前,波前残差方均根值小于0.1λ。建立实验光路并实现了对低阶像差波前的探测,波前残差方均根值小于0.5λ。仿真和实验结果均表明,CAPIS技术可有效地探测低阶像差波前,该结果对探索大视场波前探测方法具有重要意义。
Abstract
The technology of computationally adaptive plenoptic imaging system (CAPIS) can simultaneously record the position and direction of a signal, obtain the distorted wavefront slope from the light field information, and thus perform the wavefront reconstruction. This study investigates the optical wavefront distortion detected by the CAPIS technology, and provides a numerical calculation model for simulation analysis. The results denote that the CAPIS technology can accurately detect a low-order aberration wavefront. Furthermore, the root mean square value of the wavefront residual is less than 0.1λ. The experimental light path is established, and the detection of the low-order aberration wavefront is realized and the root mean square value of the wavefront residual is less than 0.5λ. The simulation and experimental results denote that the CAPIS technology can effectively detect a low-order aberration wavefront, which is considerably significant for exploring one large-field wavefront detection method.

柯熙政, 杨珂, 张颖. CAPIS技术探测波前畸变的实验研究[J]. 激光与光电子学进展, 2019, 56(12): 120101. Xizheng Ke, Ke Yang, Ying Zhang. Experimental Study onWavefront Distortion Detection Using CAPIS Technology[J]. Laser & Optoelectronics Progress, 2019, 56(12): 120101.

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