中国激光, 2003, 30 (8): 739, 网络出版: 2006-06-27
高精度测量F P标准具间距的光谱方法 
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Spectrum Method of F-P Etalon Spacing High Precision Measurement
光学技术与仪器 F-P标准具 高分辨率光谱分析仪 多光束干涉 optical technique and instrument F-P etalon high precision optical spectrum analyzer multi-beam interference
摘要
利用高分辨率光谱分析仪对空气隙F-P标准具透射谐振峰频率进行测量，然后通过直线拟合获得自由谱域，从而计算得出F-P标准具的间距。对F P标准具间距测量的精度进行分析，F P标准具间距测量的相对误差为2×10 -3。提出了一种新颖的入射光与F-P标准具垂直的精确调节方法。
Abstract
In this paper, a method was reported that used a high precision optical spectrum analyzer to measure transmission resonant frequency of air gap F-P etalon and got its free spectrum range by linear fitting. The spacing of F-P etalon was calculated based on this. The measuring precision of this method was analyzed, which showed that the relative error of F P etalon spacing measurement was 2×10 -3 . A novel method of F-P etalon perpendicularity adjusting was introduced as well.
黄文财, 谢建平, 吕亮, 陈曦曜, 明海, 鲁拥华, 王安廷. 高精度测量F P标准具间距的光谱方法[J]. 中国激光, 2003, 30(8): 739. 黄文财, 谢建平, 吕亮, 陈曦曜, 明海, 鲁拥华, 王安廷. Spectrum Method of F-P Etalon Spacing High Precision Measurement[J]. Chinese Journal of Lasers, 2003, 30(8): 739.
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