光学学报, 2004, 24 (1): 99, 网络出版: 2006-06-12
用衍射光栅和CCD测量透明材料折射率
Refraction Index Measurement of Transparent Materials by Using Diffraction Grating and CCD
光学测量 干涉与衍射 折射率 衍射光栅 透明介质 optical measurement interference and diffraction refraction index diffraction grating CCD CCD transparent material
摘要
介绍了一种基于衍射光栅干涉和CCD图像测量的测量透明材料折射率的方法.这种方法使用的仪器少,操作简单,配合CCD与图像处理的运用,尝试的两种测量方案都使精度能够达到10-4.两种测量方案对同一玻璃基片的测量结果基本吻合,而第二种测量方案的测量精度要优于第一种,这是因为就我们目前的实验条件而言,CCD判别条纹移动的精度对折射率测量的影响要小于角度测量精度对之的影响.该方法还可以测量各向同性透明薄膜样品的折射率,为探索新型有机薄膜的折射率及其有关特性提供便利的手段.讨论了测量的基本原理和样品的测量结果,并对实验方法误差进行了分析.
Abstract
An experimental method for the refraction index measurement of transparent materials is described,based on the interference of expanded and collimated laser beams that are diffracted by a grating. The interference pattern is captured by a CCD camera,and processed with a home-made software. The optical arrangement is simple and easy to manipulate. The precision of the refraction index measurement is of the order of 10 -4 . Two ways have been provided to carry out the measurements,the second seems to be better in our case, and the angle measurement accuracy is more important than fringe movement positioning. Its application to isotropic polymetric thin film is also presented.
邓广安, 蔡志岗, 张运华, 徐宇科, 吴水珠, 周建英. 用衍射光栅和CCD测量透明材料折射率[J]. 光学学报, 2004, 24(1): 99. 邓广安, 蔡志岗, 张运华, 徐宇科, 吴水珠, 周建英. Refraction Index Measurement of Transparent Materials by Using Diffraction Grating and CCD[J]. Acta Optica Sinica, 2004, 24(1): 99.
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