光学学报, 2002, 22 (1): 30, 网络出版: 2006-08-08
超分辨相变光盘的膜层计算与分析
Calculation and Analysis of Multilayers for Phase-Change Super-Resolution Optical Disks
摘要
利用多层膜反射率的矩阵法计算了GeSbTe超分辨相变光盘的光学参数与各膜层厚度之间的关系,最后得到了较为理想的膜层厚度匹配.
Abstract
Ge-Sb-Te is a kind of phase-change optical recording material with good performance. It can be used as mask layer in the super-resolution optical disks. The relation of the multilayer′s optical parameters (reflectivity and reflectivity contrast) and the film thickness of the structure of the six layers of phase-change super-resolution optical disks are studied. The ideal result of thickness for each layer is given.
李进延, 阮昊, 干福熹. 超分辨相变光盘的膜层计算与分析[J]. 光学学报, 2002, 22(1): 30. 李进延, 阮昊, 干福熹. Calculation and Analysis of Multilayers for Phase-Change Super-Resolution Optical Disks[J]. Acta Optica Sinica, 2002, 22(1): 30.