光学学报, 2002, 22 (3): 379, 网络出版: 2006-08-08
软X光平面镜反射率标定实验
Reflectivity Calibration of Soft X-Ray Planar Mirror in the BSRF
摘要
报道了掠入射软X光平面镜反射率标定实验.实验利用北京同步辐射装置(BSRF)-3W1B束线及反射率计靶室,在束流35 mA～110mA、贮存环电子能量2 GeV专用光运行模式下,在50 eV～850eV能区分四个能段,进行了5°掠入射Ni平面镜反射率标定实验.标定过程中用高灵敏度无死层的硅光二极管代替X射线二极管作探测器,输出信号提高2～3个量级,可标定能区从150eV～270 eV拓展到50 eV～850 eV,给出了完整的 5°Ni平面镜反射率标定曲线.最后把实验数据与理论计算作了比对并进行了分析.
Abstract
The calibration experiment of glancing incidence soft X ray planar mirror reflectivity is reported. The Beijing synchrotron radiation facility(BSRF) 3W1B beam line and target chamber with reflectometer was used. Under the specific operation mode of beam current 35 mA～110 mA, the storage ring electron energy 2 GeV, photon energies 50 eV～850 eV. 50 eV～850 eV energy region was divided into four energy sections. The calibration experiment for reflectivity of 5° grazing incidence Ni planar mirror was done. High sensitivity silicon photodiode without dead layer was used as detector replacing X ray diode during the calibration. Therefore,2 to 3 orders of magnitude of the signal noise ratio are increased, and the calibration region is expanded from 150 eV～270 eV to 50 eV～850 eV. The entire calibration curve for 5° Ni planar mirror reflectivity is given. The values of experiment and theoretical calculation are compared and analyzed.
孙可煦, 易荣清, 黄天, 杨家敏, 江少恩, 崔延莉, 丁永坤, 张保汉, 崔明启, 朱佩平, 赵屹东, 黎刚. 软X光平面镜反射率标定实验[J]. 光学学报, 2002, 22(3): 379. 孙可煦, 易荣清, 黄天, 杨家敏, 江少恩, 崔延莉, 丁永坤, 张保汉, 崔明启, 朱佩平, 赵屹东, 黎刚. Reflectivity Calibration of Soft X-Ray Planar Mirror in the BSRF[J]. Acta Optica Sinica, 2002, 22(3): 379.
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