通过高功率二极管激光器封装实验对二极管激光器单元的封装工艺可靠性进行了物理分析,对组装的大功率阵列二极管激光器以及抽运模块的失效特性进行了分析。根据分析结果,提出了高功率二极管激光器单元以及大功率阵列激光器的可靠性测试方法。任意抽取经过可靠性测试的激光器,在冷却水温20 ℃条件下进行寿命测试,根据实验结果得出退化率,推算出准连续二极管激光器在水温20 ℃,电流150 A,占空比为15％(500 Hz,300 μs)时,平均激光工作寿命达到5×109次脉冲,且寿命测试过程中激光器再没有发生失效。结果表明,经过单元老化筛选后的二极管激光器,其运行可靠性得到进一步保证。

The reliability of packaging technique about diode laser (DL) unit and the defect characteristics of high power DL stack and pumping module are analyzed. Testing methods for the reliability of high power DL unit and stack is made. Random samples selected from the lasers passing the reliability tests were used for lifetime test. Under the conditions of cooling water temperature of 20 ℃, current of 150 A, and duty cycle of 15% (500 Hz, 300 μs), the experimental results led to an estimated lifetime of 5×109 shots. No defect was found during the lifetime test. It was demonstrated that the reliability of diode lasers could be assured after filtrating.