红外与毫米波学报, 2001, 20 (2): 123, 网络出版: 2006-05-10
背面直接取样结构电光取样的空间分辨率
SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE
摘要
介绍了电光取样系统空间分辨率的测量原理和方法,实验结果表明,建立的电光取样仪的空间分辨率为3μm.
Abstract
The principle and method for measuring the spatial resolution of electrooptic sampling systems were introduced. According to the experimental results, the spatial resolution of the electrooptic sampling instrument established by the authors is 3μm.
贾刚, 陈占国, 曹杰, 衣茂斌, 孙伟, 高鼎三. 背面直接取样结构电光取样的空间分辨率[J]. 红外与毫米波学报, 2001, 20(2): 123. 贾刚, 陈占国, 曹杰, 衣茂斌, 孙伟, 高鼎三. SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE[J]. Journal of Infrared and Millimeter Waves, 2001, 20(2): 123.
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