用超高真空蒸发技术在GaAs(100)和玻璃衬底上生长不同厚度Mn/Sb多层膜,并经短时间热退火(～1,20min).磁化强度测量显示具有很强的室温铁磁特性.当多层膜厚度从700A增至1600A时,饱和强度增加了近一倍,极向和纵向克尔角也增加了,但不到一倍.这表明磁化强度和克尔角两者均依赖于多层摸的厚度,但不是简单的正比于厚度的关系.增加Mn/Sb多层膜的厚度能增强饱和磁化强度和极向和纵向克尔饱和角.X射线衍射谱图结果表明高质量单晶结构的Mn/Sb多层膜能用超高真空蒸发技术生长,对较厚的多层薄膜,热退火的时间可很短(约1min).

Mn/Sb multilayer filmswith different thicknesses were grown on GaAs(100) and glass by ultrahigh vacuum(UHV)evaporation technique and then annealing for a short duration(1 or 20 min). Magnetizationmeasurements revealed strong room temperature ferromagnetism. And when the thickness oflayers was increased from 700 to 1600,the saturation magnetization increased nearlydouble; and the polar and longitudinal Kerr saturation angles θk increased too, but less than two times. It indicates that both themagnetization and Kerr rotation angle depend on the thickness of layers, but are notsimply proportional to the thickness of the layers. The saturation magnetization and boththe polar and longitudinal Kerr saturation angles can be enhanced with increasing thethickness of the layers. X ray diffraction(XRD) pattern results show that high qualitycrystal structures of thicker Mn/Sb films can be fabricated by UHV evaporation techniquewith subsequent thermal annealing for a very short duration(about 1 min).