强激光与粒子束, 2004, 16 (6): 689, 网络出版: 2006-05-15
高功率二极管激光器寿命测试
Lifetime testing of high power diode laser
摘要
介绍了高功率激光二极管不同模式的失效机理,分析了激光二极管不同的寿命测试方法;在冷却水温20℃和实际工作温度下分别对封装的激光器进行了寿命测试.根据试验结果得出退化率,推算出准连续二极管激光器在水温20℃,电流90A,占空比为10%(500Hz,200μs)时,平均激光工作寿命为2.19×109次脉冲;冷却水温35℃时,其平均激光工作寿命下降为1.65×109次脉冲.由实验结果分析得出,高功率激光器封装工艺中的焊料沉积和多层焊接技术,以及工作环境温度是影响激光器可靠性和寿命的关键因素.
Abstract
This paper introduces a failure mechanism of defferent modes and lifetime test methods for high power diode laser.The diode laser lifetime is tested.According to the experimental result and degradation rate to calculate,out power of QCW diode laser reach 91W and 1.16W/A of slope efficiency,the average lifetime is 2.19×109 shots at room temperature,when the operating current is 90A,10% duty-cycle(500Hz,200μs). But the average lifetime of DL reduce to 1.65×109 when the actual temperature is 35℃.Experimental results and analysis show that the environment temperature,deposit solder and multiple layers welding in the package technology are the key point to the reliability of diode laser.
高松信, 魏彬, 吕文强, 武德勇. 高功率二极管激光器寿命测试[J]. 强激光与粒子束, 2004, 16(6): 689. GAO Song-xin, WEI Bin, Lü Wen-qiang, WU De-yong. Lifetime testing of high power diode laser[J]. High Power Laser and Particle Beams, 2004, 16(6): 689.