自愈式金属化膜脉冲电容器广泛应用于各类激光装置的能源系统中,它的可靠性直接影响到系统的可靠性与运行费用.在参考国外相关研究方法的基础上,分析了金属化膜脉冲电容器的失效机理,提出了一种新的耗损失效模型Gauss-Poisson模型,该模型将电容器的损耗分成自然损耗和突发损耗,与脉冲电容器传统的寿命分布模型Weibull模型相比具有预测更为精确的特点,而且基于该模型的寿命试验具有设计简单、时间较短、费用较低等优点,是一种较好的退化失效模型,应用前景较为广阔.

The high energy density self-healing metallized film pulse capacitor has been applied to all kinds of laser facilities for their power conditioning systems, whose reliability and expense are straightforwardly affected by the reliability level of the capacitors. Based on the related research in literature, this paper analyses the degradation mechanism of the capacitor, and presents a new degradation failure modelthe Gauss-Poisson model.The Guass-Poisson model divides degradation of capacitor into naturalness degradation and outburst one.Compared with traditional weibull failure model, the new model is more precise in evaluating the lifetime of the capacitor, and the life tests for this model are simple in design, and lower in the cost of time or expense.The Gauss-Poisson model will be a fine and widely used degradation disable model.