强激光与粒子束, 2002, 14 (2): 317, 网络出版: 2006-05-15
强流短脉冲电子束束剖面的时间分辨测量
Time-resolved beam profile measurement of high-current,short-pulse electron-beam
强流短脉冲电子束 束剖面 切伦科夫辐射 注入器 high current short pulse electron beam beam profile Cerenkov radiation injector
摘要
介绍了一套基于切伦科夫辐射的、用于强流短脉冲电子束束剖面测量的装置.装置利用扫描相机记录背面打毛的石英玻璃薄片中产生的切伦科夫光信号.使用该装置,在中国工程物理研究院流体物理研究所的2MeV注入器上进行了切伦科夫光的验证实验和时间分辨的束剖面测量实验.分析表明,测量系统的时间分辨率和空间分辨率分别为1.75ns和0.74mm.
Abstract
A beam profile diagnostic system of high current, short pulse electron based on Cerenkov radiation is introduced. Cerenkov radiation signals produced by thin quartz foil placed in the beam path are detected with streak camera. Experiments confirming Cerenkov radiation and time resolved beam profile measurement are realized with this system on the 2MeV injector of CAEP. The resolution of the system is estimated to be about 0.74mm and 1.75ns.
陈思富, 丁伯南, 夏连胜, 畅理华, 章林文, 汪伟, 李勤. 强流短脉冲电子束束剖面的时间分辨测量[J]. 强激光与粒子束, 2002, 14(2): 317. 陈思富, 丁伯南, 夏连胜, 畅理华, 章林文, 汪伟, 李勤. Time-resolved beam profile measurement of high-current,short-pulse electron-beam[J]. High Power Laser and Particle Beams, 2002, 14(2): 317.
PDF全文
