光散射学报, 2005, 17 (1): 16, 网络出版: 2006-05-19
纳米TiO2薄膜的带宽研究
Investigation on Bandgap Width of Nanometer TiO2 Thin Films
摘要
利用磁控溅射方法制备了纳米TiO2 薄膜,通过Raman光谱和UV Vis光谱讨论了TiO2 薄膜的带宽随着厚度变化的规律。随着薄膜厚度的增加,TiO2 薄膜的带宽变窄,这是由于纳米薄膜的纳米效应所致
Abstract
The TiO2 films were prepared on Si (100) substrates by RF magnetic sputtering PVD. The bandgap width of nanometer TiO2 thin films was investigated by using Raman spectra and Ultraviolet-visible (UV-Vis) Spectra. The bandgap width of TiO2 thin films narrows with the increase of thickness due to nano-effects of nanometer thin films.
顾广瑞, 金逢锡, 陶影, 李全军, 李哲奎, 金哲, 赵永年, 郑伟涛, 金曾孙. 纳米TiO2薄膜的带宽研究[J]. 光散射学报, 2005, 17(1): 16. 顾广瑞, 金逢锡, 陶影, 李全军, 李哲奎, 金哲, 赵永年, 郑伟涛, 金曾孙. Investigation on Bandgap Width of Nanometer TiO2 Thin Films[J]. The Journal of Light Scattering, 2005, 17(1): 16.