有些光电检测设备要求高的探测概率和低的虚警概率,使用单次检测不能达到要求.若采用积累检测法则能满足系统要求.通过对积累检测在不同类型光电设备中的应用分析,建立了不同的数学模型,推导出各模型的探测概率和虚警概率的计算公式,并给出了相应的计算结果.计算结果表明:积累检测在主动探测设备中使用不连续的"K out of N"模型,能够有效提高探测概率,降低虚警概率.但在被动探测设备中,探测概率有所下降,虚警概率会大大降低.

Some optoelectronic detection equipment are required to have high detection probability and low false alarm probability. Single detection method can not satisfy these requirements, but accumulative detection method can do. Based on the analysis on application of accumulative detection in optoelectronic systems, the mathematic models are founded, and the formulae of detection probability and false alarm probability are derived. The calculated results presented indicate that the model of discontinuous K out of N used in active detection equipment can effectively improve detection probability and reduce false alarm probability, but in passive detection equipment detection probability will be somewhat ameliorative, and false alarm probability will be reduced obviosly.