光子学报, 2005, 34 (8): 1233, 网络出版: 2006-06-12
二次曝光全息术对微波等离子体推进器羽流的诊断及计算机模拟
Double-exposed Holographic Interferometry Diagnose in Microwave Plasma Thruster's Plume and Simulation by Computer
摘要
二次曝光全息术是诊断等离子体电子数密度的一个有效测量方法,具有非接触式测量及不受等离子体发光干扰等优点.根据阿贝尔变换公式,通过计算机应用matlab程序数值模拟了各种不同电子数密度状态下的等离子体干涉图.同时拍摄了航天器中微波等离子体推进器羽流的二次曝光全息图,再现了不同状态下的干涉图样.通过分析和对比两次干涉图,得出了羽流的电子数密度.
Abstract
Double-exposed holographic interferometry is an effective means in the plasma number density of electronic diagnosis, for it has such merits as non-contact measurement and non-disturbance by plasma luminescence. According to Abel transform, simulated interferograms of various plasma′s electron densities are obtained;by double-exposed holographic interferometry, interferograms of various spacecraft microwave plasma thruster′s plumes are gotten.The electron density of plume is gained by analyzing and contrasting the measured interferograms and simulated ones.
冯伟, 李恩普, 张琳, 范琦, 林榕. 二次曝光全息术对微波等离子体推进器羽流的诊断及计算机模拟[J]. 光子学报, 2005, 34(8): 1233. 冯伟, 李恩普, 张琳, 范琦, 林榕. Double-exposed Holographic Interferometry Diagnose in Microwave Plasma Thruster's Plume and Simulation by Computer[J]. ACTA PHOTONICA SINICA, 2005, 34(8): 1233.