Chinese Optics Letters, 2003, 1 (7): 07420, Published Online: Jun. 6, 2006  

Readout of super-resolution marks with Ti thin film

Author Affiliations
1 Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
2 East China Normal University, Shanghai 200062
Abstract
Using Ti as the super-resolution reflective film to replace the Al reflective layer in conventional read-only optical disk, the recording marks with a diameter of 380 nm and a depth of 50 nm are read out in a dynamic testing device whose laser wavelength is 632.8 nm and numerical aperture of the lens is 0.40. The optimum Ti thin film thickness is 18 nm and the corresponding signal-noise-ratio is 32 dB.

Jingsong Wei, Yang Wang, Wendong Xu, Zhenrong Sun, Feng Zhang, Fei Zhou, Fuxi Gan. Readout of super-resolution marks with Ti thin film[J]. Chinese Optics Letters, 2003, 1(7): 07420.

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