Chinese Optics Letters, 2003, 1 (7): 07420, Published Online: Jun. 6, 2006
Readout of super-resolution marks with Ti thin film
210.4590 optical disks 210.4680 optical memories 160.4330 nonlinear optical materials 190.4720 optical nonlinearities of condensed matter
Abstract
Using Ti as the super-resolution reflective film to replace the Al reflective layer in conventional read-only optical disk, the recording marks with a diameter of 380 nm and a depth of 50 nm are read out in a dynamic testing device whose laser wavelength is 632.8 nm and numerical aperture of the lens is 0.40. The optimum Ti thin film thickness is 18 nm and the corresponding signal-noise-ratio is 32 dB.
Jingsong Wei, Yang Wang, Wendong Xu, Zhenrong Sun, Feng Zhang, Fei Zhou, Fuxi Gan. Readout of super-resolution marks with Ti thin film[J]. Chinese Optics Letters, 2003, 1(7): 07420.