Chinese Journal of Lasers B, 2000, 9 (5): 417, 网络出版: 2006-08-08  

Laser Vision Measurement System and Assessment Method for SMIC Lead Coplanarity

Laser Vision Measurement System and Assessment Method for SMIC Lead Coplanarity
作者单位
State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
摘要
Abstract
In this paper, a successful application of line-structured laser sensor, involved in SMIC chip lead coplanarity measurement, is presented. With the experimental measurement system and its corresponding mathematics model, a contact-datum-plane assessment of SMIC chip lead coplanarity is developed to provide method for on-line measurement.

SUN Changku, QIU Yu, XUE Xiaojie, YE Shenghua. Laser Vision Measurement System and Assessment Method for SMIC Lead Coplanarity[J]. Chinese Journal of Lasers B, 2000, 9(5): 417. SUN Changku, QIU Yu, XUE Xiaojie, YE Shenghua. Laser Vision Measurement System and Assessment Method for SMIC Lead Coplanarity[J]. 中国激光(英文版), 2000, 9(5): 417.

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