对几种测量折射率结构常数(C2n)的方法进行了分析和比较, 指出这几种方法的测量结果有时不一致的原因。 结果表明, 和双点法测量相比, 温度谱幂率的变化对闪烁法测量结果造成较大偏差, 而对到达角起伏测量和声雷达测量结果差别较小; 外尺度改变对闪烁法测量几乎没有影响, 但当外尺度变小时, 利用双点法测量, 到达角起伏测量和声雷达测量结果都有较大的影响。 给出了双点测量C2n和外尺度的关系的实验验证, 并给出了两固定点之间的合适距离。

Several methods of measuring C2n (refractive index structure parameter) are analyzed and compared, and the reason of leading this different measuring result is given. It is shown that the result of scintillation will change notably with power of temperature spectra when comparing with the result of double-point, but power of temperature spectra takes a little effect on angle-of-arrival variances and back-scattering of electromagnetic wave when comparing with the result of double-point. When outer-scale changes, the value of C2n with scintillation almost keeps equal, but when outer-scale decreases, the value of C2n with double-point and arrival angle will decreases very much. Especially, the relation between the double-point method and out-scale is verified, and the acceptable interval between two points is recommended.