Chinese Journal of Lasers B, 2001, 10 (1): 57, 网络出版: 2006-08-10  

Nonlinear Absorption Properties of nc-Si:H Thin Films

作者单位
1 Department of Applied Physics, Huaqiao University, Quanzhou 362011, China
2 The College of Precision Instrument and Optoelectronics Engineering,Tianjin University. Tianjin 300072, China
3 National Intergrated Optoelectronic Lab., Institute of Semiconductors, The Chinese Academy of Sciences, Beijing 100083, China
摘要
Abstract
It is reported in this paper that the phenomenon of the saturated absorption of the exciton in hydrogenated nanocrystalline silicon (nc-Si:H) thin film fabricated by plasma enhanced chemical vapor deposition (PECVD) without any post-processing is observed at room temperature using pump-probe technology. This nonlinear optical absorption property is induced by the surface effect of the silicon nanoparticles in nc-Si:H thin films.

GUO Zhenning, GUO Hengqun, LI Shichen, HUANG Yongzhen, WANG Qiming. Nonlinear Absorption Properties of nc-Si:H Thin Films[J]. Chinese Journal of Lasers B, 2001, 10(1): 57. GUO Zhenning, GUO Hengqun, LI Shichen, HUANG Yongzhen, WANG Qiming. [J]. 中国激光(英文版), 2001, 10(1): 57.

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