光学学报, 2001, 21 (1): 122, 网络出版: 2006-08-10
硅基二氧化硅光波导器件偏振特性的理论分析
Theoretical Analysis on Polarization Characteristics of Silicon-Based Silica Optical Waveguide Devices
摘要
从理论上分析了硅基二氧化硅光波导器件的芯区尺寸、相对折射率差、内应力和弯曲半径对器件偏振特性的影响,得出结论:小折射率差的正方形波导的双折射系数小;内应力对双折射的影响比几何参数大;弯曲半径较小时,双折射系数较大,弯曲损耗也较大。
Abstract
The influence of core size, relative refractive index difference, stress and bending radius of silicon-based silica waveguides on polarization was analyzed. Conclusions were drawn as below: the birefringence of square waveguide with small relative index difference is small. The birefringence caused by residual stress is larger than that by core size. Small bending radius causes high birefringence and loss, so large bending radius is preferred within the permission of chip size to reduce birefringence.
欧海燕, 雷红兵, 杨沁清, 王红杰, 王启明, 胡雄伟. 硅基二氧化硅光波导器件偏振特性的理论分析[J]. 光学学报, 2001, 21(1): 122. 欧海燕, 雷红兵, 杨沁清, 王红杰, 王启明, 胡雄伟. Theoretical Analysis on Polarization Characteristics of Silicon-Based Silica Optical Waveguide Devices[J]. Acta Optica Sinica, 2001, 21(1): 122.