中国激光, 1998, 25 (9): 852, 网络出版: 2006-10-18
反射式扫描近场光学显微镜及其成像
Reflection Scanning Near field Optical Microscope and its Imaging
反射模式 衰逝波 相干探测 光强梯度 SNOM SNOM reflection mode evanescent wave interference detection light intensity gradient
摘要
介绍了一种光纤探针同时作为光源和探测器的反射式扫描近场光学显微镜,该装置通过采用相干探测、偏振分光等技术克服了该类显微镜所普遍面临的噪声背景干扰问题,具有较高的光学信噪比,并通过样品纵向振动调制锁相实现了对样品表面光强梯度信号的探测成像,进一步改善了成像质量。成像研究表明该装置可对近场衰逝分量进行有效探测并实现了超衍射极限成像。
Abstract
A novel reflection scanning near field optical microscope(RSNOM) which uses a fiber probe as both the light source and detector was developed. By means of interference detecting and polarization beam splitting detecting, the RSNOM eliminated the background noise disturbance which is commonly encountered in this kind of SNOM, and a high optical signal/noise ratio was achieved. Moreover, by vertically vibrating the sample, the light signal was modulated and detected with a lock-in amplifier, and the light intensity gradient imaging of the sample surface was realized, which further improved the image quality.This research shows that the RSNOM could detect the evanescent near-field wave effectively, and the image with a super-diffraction-limit resolution was obtained.
王刚, 赵钧, 刘静勇, 张培林. 反射式扫描近场光学显微镜及其成像[J]. 中国激光, 1998, 25(9): 852. 王刚, 赵钧, 刘静勇, 张培林. Reflection Scanning Near field Optical Microscope and its Imaging[J]. Chinese Journal of Lasers, 1998, 25(9): 852.