光学学报, 1998, 18 (9): 1234, 网络出版: 2006-10-18
应用小波边缘检测技术分析荧光寿命显微像
Application of Wavelet Edges Detection Method in Fluorescence Lifetime Imaging Microscopy
荧光寿命显微像 小波 边缘检测 多尺度分析 fluorescence lifetime imaging microscopy wavelet edges detection multiscale analysis
摘要
研究了小波图像边缘检测技术在荧光寿命显微像分析中的应用,利用小波分析的多尺度特性进行了荧光寿命显微像的边缘提取。结果表明,这种方法非常有效。
Abstract
The application of wavelet multiscale edges detection method in the fluorescence lifetime imaging microscopy is studied. A Fluorescence lifetime image is analyzed, and the results show that this method is very effective.
屈军乐, 陈德智, 牛憨笨. 应用小波边缘检测技术分析荧光寿命显微像[J]. 光学学报, 1998, 18(9): 1234. 屈军乐, 陈德智, 牛憨笨. Application of Wavelet Edges Detection Method in Fluorescence Lifetime Imaging Microscopy[J]. Acta Optica Sinica, 1998, 18(9): 1234.