Chinese Optics Letters, 2006, 4 (11): 675, Published Online: Nov. 17, 2006  

Symmetrical periods used as matching layers in multilayer thin film design Download: 548次

Author Affiliations
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
Abstract
Properties of symmetrical layers as matching layers in multilayer thin film design were analyzed. A calculation method was presented to derive parameters of desired equivalent refractive index. A harmonic beam splitter was designed and fabricated to test this matching method.

Dan Wang, Zhengxiu Fan, Jianbing Huang, Jun Bi, Yingjian Wang. Symmetrical periods used as matching layers in multilayer thin film design[J]. Chinese Optics Letters, 2006, 4(11): 675.

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