研究了在玻璃基底上采用不同厚度的铬膜作过渡层,对银膜的光学性质及其附着力的影响。光谱测量结果表明,随着铬膜层厚度的增加,银膜的反射率先增大后减小。与直接镀在玻璃基底上的银膜的反射率相比,铬膜层厚度为8～14 nm时,银膜的反射率较低; 铬膜层厚度为17～21 nm时,银膜的反射率得到提高,其中铬膜厚度为17 nm时,银膜的反射率最高; 继续增加铬膜层的厚度,银膜的反射率又降低,说明采用一定厚度的铬膜作过渡层可以提高银膜的反射率。X射线衍射(XRD)结构分析表明,一定厚度的铬膜改善了银膜的结晶程度,使薄膜的晶粒度增大,晶界散射及缺陷减少,从而使应变减小。剥落实验证明薄膜与玻璃基底之间的附着力也得到了提高。

Optical properties and adhesion of Ag films with Cr interlayer of different thickness on glass substrates were investigated by using spectrophotometer and X-ray diffraction (XRD). The spectra results showed that the reflectivity of Ag films increased with the thickness of Cr interlayer increasing from 8 to 17 nm and then decreased with increasing Cr film thickness to 24 nm. Compared with pure Ag films on glass substrates, the reflectivity of Ag films with 17～21 nm Cr interlayer was higher and that of Ag films with 8～14 nm and 24 nm Cr interlayer was lower. Thus, the reflectivity of Ag film can be promoted by introducing a certain thickness of Cr interlayer. The XRD analysis showed that with a certain thickness of Cr interlayer, the crystalline grains increased, intergranular defects and scattering decreased, and so the strain decreased. The adhesion was also improved by using the tape test method.