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A spectroscopic method for determining thickness of quartz wave plate

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Abstract

A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS) curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to 2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.

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收稿日期:2006-06-27

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冯伟伟:State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
林礼煌:State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
陈立刚:Remote Sensing Laboratory, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031
朱化凤:College of Physics Science and Technology, China University of Petroleum, Qingdao 266555
李儒新:State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
徐至展:State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

备注:This work was supported by the National Basic Research Program of China (973 Program) under Grant No. 2006CB806000. W. Feng's e-mail address is fww@siom.ac.cn

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