光学学报, 2014, 34 (7): 0730001, 网络出版: 2014-06-25
薄膜法X射线荧光光谱对重金属铬元素检测研究
Study of Thin-Film Method X-Ray Fluorescence Spectroscopy for Detecting Heavy Metal Chromium Element
X射线光学 Cr检测 X射线荧光 薄膜法 重金属 富集 X-ray optics detection of Cr X-ray fluorescence thin film method heavy metal preconcentration
摘要
研究了重金属Cr元素薄膜法X射线荧光(XRF)光谱分析中的滤膜,结果表明亲水性聚四氟乙烯滤膜对Cr元素富集具有较好的均匀性,并且对该滤膜上Cr元素进行XRF光谱测量具有较好的灵敏度。利用亲水性聚四氟乙烯滤膜对不同浓度的Cr元素进行富集,并且利用XRF光谱进行测试,结果表明当Cr元素的面积浓度在3.84~167 μg·cm-2范围内时,Cr元素XRF光谱中Kα特征谱线的积分荧光强度与Cr元素的面积浓度之间具有非常好的线性关系,线性相关系数为0.996,检测限为0.3 μg·cm-2。对实验室水龙头出来的自来水水样进行加标回收实验,得到回收率在93.85%~101.95%之间,相对标准偏差小于2%。因此,以亲水性聚四氟乙烯滤膜为富集滤膜的薄膜法XRF光谱分析法,能够很好地应用于水样中重金属Cr元素的分析与检测。
Abstract
Filter membrane in heavy metal Cr element thin film method X-ray fluorescence (XRF) spectroscopy analysis is studied. The results show that Cr element preconcentrated on hydrophilic polytebrafluoroe thylene (PTFE) membranes has good uniformity, and XRF spectroscopy detection of Cr element preconcentrated on these membranes has good sensitivity. Different mass concentrations of Cr element are preconcentrated by using hydrophilic PTFE membranes and measured by XRF spectroscopy. The results show that when area concentration of Cr element is in the range of 3.84~167 μg·cm-2, the fluorescence integrated intensity of Cr Kα characteristic spectral line has a very good linear relationship with the area concentration of Cr element. The linear correlation coefficient is 0.996, and the limit of detection is 0.3 μg·cm-2. The spiked recovery experiments on tap water samples of laboratory faucet are carried out. The obtained recoveries are between 93.85% and 101.95%, and the relative standard deviation is less than 2%. As a result, the thin film method XRF spectroscopy analysis with hydrophilic PTFE membrane as preconcentrated filter membrane can be well applied to the analysis and detection of heavy metal Cr element in water samples.
甘婷婷, 张玉钧, 赵南京, 殷高方, 董欣欣, 王亚萍, 刘建国, 刘文清. 薄膜法X射线荧光光谱对重金属铬元素检测研究[J]. 光学学报, 2014, 34(7): 0730001. Gan Tingting, Zhang Yujun, Zhao Nanjing, Yin Gaofang, Dong Xinxin, Wang Yaping, Liu Jianguo, Liu Wenqing. Study of Thin-Film Method X-Ray Fluorescence Spectroscopy for Detecting Heavy Metal Chromium Element[J]. Acta Optica Sinica, 2014, 34(7): 0730001.