激光技术, 2014, 38 (4): 445, 网络出版: 2014-06-30
弱电导材料中载流子迁移率的测量方法研究
Study on measurement method of carrier mobility in weak photoconductive material
光电子学 渡越时间法 载流子 迁移率 弱电导 optoelectronics time of flight method charge carrier mobility weak photoconductor
摘要
为了精确测定弱电导材料中载流子迁移率, 采用渡越时间方法测量了8-羟基喹啉配合物(Alq3)的载流子迁移率, 对渡越时间方法需要的实验条件进行了理论分析和实验验证, 讨论了激发光源的波长、单脉冲能量以及测量电路的积分时间常数的选取对材料载流子迁移率测量结果的影响。结果表明, 采用渡越时间方法测量弱电导半导体材料中载流子迁移率时, 只有严格选取合适的测量条件, 才可能获得准确、可靠的测试结果。此结论有助于对有机电致发光器件载流子迁移率进行精确测定。
Abstract
In order to measure the carrier mobility of weak conductive material accurately, the charge carrier mobility of Alq3 was measured with the method of time of flight (TOF). The experimental conditions of TOF were analyzed theoretically and verified experimentally. The effects of the wavelength of the excitation light source, the single pulse energy and the selection of integration time constant of circuit measurement on the material carrier mobility measurement results were discussed. The results show that TOF is a typical optical measurement method. But it is possible to obtain accurate and reliable test results when measuring the carrier mobility of weak conductive material by means of TOF only if selecting appropriate measurement conditions strictly. This conclusion is helpful for the accurate measurement of carrier mobility of organic electroluminescent device.
刘强虎, 张紫浩, 刘志春, 张晓光. 弱电导材料中载流子迁移率的测量方法研究[J]. 激光技术, 2014, 38(4): 445. LIU Qianghu, ZHANG Zihao, LIU Zhichun, ZHANG Xiaoguang. Study on measurement method of carrier mobility in weak photoconductive material[J]. Laser Technology, 2014, 38(4): 445.