光散射学报, 2014, 26 (2): 159, 网络出版: 2014-06-30
用静电自组装法制备的石墨烯薄膜特性研究
The Properties of Graphene Films Prepared by Electrostatic Self-assembly Techniques
静电自组装 层数可控 石墨烯 肼蒸汽还原 紫外吸收光谱 拉曼光谱 electrostatic self-assembly layers controllable graphene hydrazine vapor reduction ultraviolet absorption spectroscopy Raman spectroscopy
摘要
本文采用静电自组装技术制备石墨烯薄膜, 以带正电的聚乙烯亚胺作为粘结剂, 将带负电的氧化石墨烯自组装在粘结剂上, 形成多层氧化石墨烯/聚乙烯亚胺复合膜, 然后在肼蒸汽下还原得到石墨烯薄膜样品, 并利用石墨烯薄膜的紫外吸收光谱、椭圆偏振光谱、扫描电镜图谱及拉曼光谱对其层数、厚度、形貌及还原效果进行了研究。研究表明此方法制备的石墨烯薄膜具有杂质含量少、层数与膜厚微观可控且膜厚均匀等优点。通过调节组装材料种类、浓度和组装次数可制备出结构和功能自由控制的石墨烯薄膜, 且此方法与微电子工艺兼容, 易于制作石墨烯晶体管, 因此在石墨烯晶体管领域具有广阔的应用前景。
Abstract
In this paper, the electrostatic self-assembly technology has been adopted for preparing graphene-containing films, a positively charged polyethyleneimine as a binder. The negatively charged graphene oxide flakes self-assemble with the binder to form the multi-layered graphene oxide/polyethyleneimine composite ultrathin films. The obtained films are reduced in the hydrazine vapor to offer films of reduced graphene oxide. Different characterization methods have been used to analyze the produced films, including UV spectrophotometry, ellipsometry, atomic force microscopy, and scanning electron microscopy. From the analyzed results, it is found that the layers of graphene oxide can be precisely controlled by using electrostatic self-assembly method. The obtained composite films show excellent properties, such as uniform thickness, smooth surface and low impurity. By adjusting the assembled material type, concentration and assembly times, graphene films with controlled membrane structure and function can be obtained. This method is compatible with microelectronics technology, to produce graphene transistors. This approach has broad application prospects in the field of graphene transistors.
刘杰, 王彬, 石瑞英, 王婧, 刘沛波, 吴运熹, 翁志超. 用静电自组装法制备的石墨烯薄膜特性研究[J]. 光散射学报, 2014, 26(2): 159. LIU Jie, WANG Bin, SHI Rui-ying, WANG Jing, LIU Pei-bo, WU Yun-xi, WENG Zhi-chao. The Properties of Graphene Films Prepared by Electrostatic Self-assembly Techniques[J]. The Journal of Light Scattering, 2014, 26(2): 159.