Chinese Optics Letters, 2005, 3 (0s): 213, Published Online: Mar. 5, 2007  

Absorptive and refractive nonlinearity of carbon nanotubes grown on Si substrate Download: 540次

Author Affiliations
1 Department of Physics, Wuhan University, Wuhan 430072
2 Department of Physics, Tsinghua University, Tsinghua-Foxconn Nanotechnology Research Center, Beijing 100084
3 Center of Nanoscience and Nanotechnology Research, Wuhan University, Wuhan 430072
Abstract
The third-order susceptibility of multiwalled carbon nanotubes (MWCNTs) grown on Si substrate were measured using reflective Z-scan (RZ-scan) technique with femto-second laser pulses at 790 nm. The nonlinear absorption coefficient 'beta' and nonlinear refraction index 'gamma' were measured to be about 9*10^(2) cm/GW and 9.6*10^(-3) cm2/GW, respectively. This is about one order of magnitude larger than the measurement of MWCNTs on transparent quartz substrate. The enhanced optical nonlinearities are contributed by the enhanced local field and the photoinduced off-resonant absorption of the 'pi'-plamon of MWCNTs on Si.

Daijian Chen, Peng Liu, Si Xiao, Sha Ding, Ququan Wang. Absorptive and refractive nonlinearity of carbon nanotubes grown on Si substrate[J]. Chinese Optics Letters, 2005, 3(0s): 213.

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