Chinese Optics Letters, 2005, 3 (0s): 316, Published Online: Mar. 5, 2007
Comparison of AF/RSNOM with other RSNOM
110.0110 Imaging systems 180.0180 Microscopy 120.0120 Instrumentation, measurement, and metrology 110.0180 Microscopy
Abstract
AF/RSNOM is a new kind of scanning probe microscope developed in our lab, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) working in equi-amplitude tapping mode. This paper introduces the principle of AF/RSNOM and its advantages compared with other reflection mode scanning optical microscopes (RSNOM). Compared with the former RSNOM, this tapping mode AF/RSNOM has convenient operation and fewer background signals.
Yinli Li, Jian Zhang, Shifa Wu, Pengfei Li, Shi Pan. Comparison of AF/RSNOM with other RSNOM[J]. Chinese Optics Letters, 2005, 3(0s): 316.