Chinese Optics Letters, 2007, 5 (11): 660, Published Online: Nov. 14, 2007
Analysis, fabrication, and measurement of Y aperture element frequency selective surface 
Download： 543次
频率选择表面 周期阵列 传输系数 070.6110 Spatial filtering 240.0310 Thin films 220.3740 Lithography 240.6700 Surfaces
Abstract
The analysis of Y aperture element frequency selective surface (FSS) using the spectral domain method and the moment method is presented. With the vacuum depositing and photolithography, the corresponding Y aperture element FSS was produced, and it was tested in the microwave darkroom. The calculated and measured results are in good agreement.
Xiaoqiu Li, Jianmin Zhou, Jinsong Gao. Analysis, fabrication, and measurement of Y aperture element frequency selective surface[J]. Chinese Optics Letters, 2007, 5(11): 660.
PDF全文
