光学学报, 1993, 13 (5): 475, 网络出版: 2007-12-07
利用光热偏转技术实施光学薄膜弱吸收的多波长测量
Measurements of weak absorption of optical coatings for multi- wavelength by photothermal deflection technique
摘要
介绍了光热表面形变光束偏转技术用于测量光学薄膜弱吸收的基本原理,简述多波长吸收测量装置的建立和测试过程,最后给出简单的测量实例.
Abstract
The basic principle of weak absorption measurements performed with photothermal deflection technique is discribed. An experimental setup with multiple pumping lasers has been constructed, the testing procedure and the results of a simple measurement example are presented.
胡文涛, 范正修, 刘立明. 利用光热偏转技术实施光学薄膜弱吸收的多波长测量[J]. 光学学报, 1993, 13(5): 475. 胡文涛, 范正修, 刘立明. Measurements of weak absorption of optical coatings for multi- wavelength by photothermal deflection technique[J]. Acta Optica Sinica, 1993, 13(5): 475.
PDF全文
