激光与光电子学进展, 2014, 51 (8): 081101, 网络出版: 2014-07-30
连续太赫兹反射式共焦扫描显微成像特性分析
Character Analysis on Continuous-Wave Terahertz Reflection-Mode Confocal Scanning Microscopic Imaging
太赫兹成像 反射式共焦扫描 分辨率 轴向偏移 横向偏移 terahertz imaging reflection-mode confocal scanning resolution axial offset transverse offset
摘要
太赫兹反射式共焦扫描显微成像系统分辨率较高且可呈现物体三维像,因此具有很大的应用价值。针对一种连续太赫兹反射式共焦扫描显微成像实验光路,在所确定的系统参数条件下,计算分析了两种太赫兹波长( 118.83 μm 和184.31 μm )的系统轴向响应特性。仿真结果表明,所设计的波长118.83 μm 的成像实验装置横向分辨率可达0.23 mm,轴向分辨率约为4.27 mm;波长184.31 μm 的系统横向分辨率可达0.36 mm,轴向分辨率约为6.63 mm。探测器轴向偏移影响大于横向偏移影响。
Abstract
Due to high resolution and the ability of reconstructing 3D image of the sample, the terahertz reflection-mode confocal scanning microscopic imaging has great application value. A terahertz reflectionmode confocal scanning microscopic imaging experimental light path is designed. Under the condition of system parameters, the axial response characteristics of the system is calculated and analyzed in the case of two kinds of different wavelengths (118.83 μm and 184.31 μm ). The results of emulation show that the designed experimental device with wavelength of 118.83 μm gains a transverse resolution of 0.23 mm and an axial resolution of about 4.27 mm. When the wavelength is 184.31 μm , the transverse resolution is 0.36 mm and the axial resolution is about 6.63 mm. In comparison with the transverse offset, the axial offset of the detector brings a greater effect.
杨永发, 李琦, 胡佳琦. 连续太赫兹反射式共焦扫描显微成像特性分析[J]. 激光与光电子学进展, 2014, 51(8): 081101. Yang Yongfa, Li Qi, Hu Jiaqi. Character Analysis on Continuous-Wave Terahertz Reflection-Mode Confocal Scanning Microscopic Imaging[J]. Laser & Optoelectronics Progress, 2014, 51(8): 081101.