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Correction of ultraviolet single photon counting image distortion

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Abstract

Single photon counting imaging technology has been widely used in space environment detection, astronomy observation, nuclear physics, and ultraweak bioluminescence. However, the distortion of the single photon counting image will badly affect the measurement results. Therefore, the correction of distortion for single photon counting image is very significant. Ultraviolet single photon imaging system with wedge and strip anode is introduced and the influence factor leading to image distortion is analyzed. To correct original distorted image, three different image correction methods, namely, the physical correction, the global correction, and the local correction, are applied. In addition, two parameters, i.e., the position index and the linearity index, are defined to evaluate the performance of the three methods. The results suggest that the correction methods can improve the quality of the initial image without losing gray information of each counting light spot. And the local correction can provide the best visual inspections and performance evaluation among the three methods.

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收稿日期:2008-03-14

录用日期:--

网络出版日期:0001-01-01

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张兴华:State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119Graduate University of Chinese Academy of Sciences, Beijing 100049
赵宝升:State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119
缪震华:State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119Graduate University of Chinese Academy of Sciences, Beijing 100049
李伟:State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119Graduate University of Chinese Academy of Sciences, Beijing 100049
朱香平:State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119
刘永安:State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119Graduate University of Chinese Academy of Sciences, Beijing 100049
邹玮:State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119

联系人作者:张兴华(xinghua146@yahoo.com.cn)

备注:This work was supported by the Knowledge Innovation Program of Chinese Academy of Sciences. X. Zhang's e-mail address is xinghua146@yahoo.com.cn.

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引用该论文

Xinghua Zhang,  Baosheng Zhao,  Zhenhua Miao,  Wei Li,  Xiangping Zhu,  Yong’an Liu,  Wei Zou, "Correction of ultraviolet single photon counting image distortion," Chinese Optics Letters 6(9), 661-664 (2008)

被引情况

【1】赵菲菲,赵宝升,赛小锋,张兴华,韦永林,邹玮. 退火对Ge薄膜及光子计数成像系统性能的影响. Chinese Optics Letters, 2010, 8(4): 361-364

【2】陈宝梅,赵宝升,胡慧君,盛立志,鄢秋荣. X射线脉冲星导航系统中脉冲轮廓的探测与拟合. 光学学报, 2011, 31(5): 534002--1

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