利用表面等离子体共振技术进行电介质样品成像研究.采用高数值孔径显微物镜作为耦合元件，632.8 nm HeNe激光会聚激发金膜产生表面等离子体共振，通过狭缝光阑限制光束入射角，对金膜上的氮化硅光栅进行成像.反射光由放置在样品像方共轭面上的CCD摄像机接收，获得样品的表面等离子体共振像.通过扫描移动狭缝，得到入射角从44°至54°的扫描样品图像，从图像中提取样品各点的表面等离子体共振曲线，由计算机重构出样品的表面等离子体共振角谱灰度图.

The surface plasmon resonance technique was used for imaging of the dielectric sample. Based on a large numerical aperture microscope objective configuration, a light beam from a HeNe laser (λ=632.8 nm) was converged to excite surface plasmon resonance on gold film. The image of Si3N4 grating on the gold film was acquired by using a slit which restricts the incident angle of imaging beam. CCD was placed to detect the reflected light and get the surface plasmon resonance image of the sample at the conjugate plane of the sample. The images of sample was obtained at incident angles from 44° to 54° via scaning of the slit. The surface plasmon resonance curves of each point of the sample was extracted from this set of images. Grayscale image of resonance angular spectra of sample was reconstructed by computer simultaneously using the resonance angles corresponding to each point of sample.