Chinese Optics Letters, 2009, 7 (5): 05432, Published Online: May. 22, 2009  

Optoelectronic characterization of ZnS/PS systems

Author Affiliations
Department of Physics and Electronics Science, Binzhou University, Binzhou 256603, China2 Physics Department, Ludong University, Yantai 264025, China3 Flying College, Binzhou University, Binzhou 256603, ChinaE-mail: cfwang_2004@163.com
Abstract
ZnS thin films are deposited on porous silicon (PS) substrates with different porosities by pulsed laser deposition (PLD). The photoluminescence (PL) spectra of the samples are measured at room temperature. The results show that the PL intensity of PS after deposition of ZnS increases and is associated with a blue shift. With the increase of PS porosity, a green emission at about 550 nm is observed in the PL spectra of ZnS/PS systems, which may be ascribed to the defect-center luminescence of ZnS films. Junction current-voltage (I-V) characteristics were studied. The rectifying behavior of I-V characteristics indicates the formation of ZnS/PS heterojunctions, and the forward current is seen to increase when the PS porosity is increased.

Caifeng Wang, Qingshan Li, Bo Hu. Optoelectronic characterization of ZnS/PS systems[J]. Chinese Optics Letters, 2009, 7(5): 05432.

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