描述了椭圆型晶体谱仪配X射线CCD相机的X射线谱测量系统(EBCS-XCCD),研究了CCD相机记录信号的解谱处理方法,推出了对实测原始谱曲线辨认或标识值的计算公式及激光等离子体辐射X射线在某一波长光谱强度的公式,使之应用在激光打靶产生的等离子体源辐射X射线谱的回推,辨认出了激光等离子体X射线源能谱,并与文献[1]的结果进行了比较,结果基本一致。测试结果证实了解谱方法的可行性,表明X射线CCD相机适用于椭圆型晶体谱仪的光谱测量记录。在已知晶体的积分反射率、滤片透射率和CCD探测效率的条件下,可以获得X射线源光谱强度,为下一步诊断激光等离子体的电子温度和离子密度的空间分布轮廓和进一步细化X射线激光研究奠定了基础。

By coupling Elliptical Bent Crystal Spectrometer (EBCS) with X-ray CCD, a set of system (EBCS-XCCD) for measuring X-ray spectra was briefly described. The calibration procedures for absolute line and line intensity measurement were studied and formulae of identification signals were deduced according to the geometrical parameters of EBCS-XCCD and physical optics. An example of calibrating spectra was presented with elliptical crystal of a-quartz (1 010,2d=0.852 nm ) for the 0.399~0.736 nm photon wavelength region. The spectrum intensity from laser plasma X-ray source was also obtained by the formula based on known the integrated reflectivity of the crystal, the transmission of foil and the responsivity of X-ray CCD photodiode to photons,results show that the good spectral resolution of laser-produced Al plasma is better than 1 000. The unfolded spectra by the method were compared with that of the reference [1], the results are basically identical. These data reported here indicate that this system is particularly suitable for the high-precision measurements of the spectral line profiles and positions in nonhomogeneous plasmas,and experimental results are superior to those obtained in earlier measurements, which demonstrates the EBCS-XCCD performance.