光学与光电技术, 2009, 7 (5): 63, 网络出版: 2009-12-30
硅陷阱探测器绝对光谱响应率校准实验研究
Experimental Studies on Si Trap Detector Absolute Spectral Responsivity Calibration
硅陷阱探测器 绝对光谱响应率 低温辐射计 不确定度评定 Si trap detectors absolute spectral responsivity cryogenic radiometer uncertainty evaluation
摘要
以Ar+Kr+激光器、He-Ne激光器和半导体泵浦激光器作为光源,利用激光稳功率装置以及闭环机械制冷型低温辐射计,校准了硅陷阱探测器的绝对光谱响应率。在硅探测器的光谱响应范围400~1 100 nm内,选择476.1 nm、488 nm、514.7 nm、521 nm、568 nm、632.8 nm、647.1 nm、1064 nm共8条谱线进行了实验研究。实验数据表明,绝对光谱响应率的测量不确定度为可见光波段优于0.02%,1 064 nm波长点优于0.03%。
Abstract
The absolute spectral responsivity of the Si trap detector is calibrated by laser intensity stabilizer and closed loop refrigeration cryogenic radiometer with Ar+Kr+ laser, He-Ne laser and PDSS laser. Eight wavelength laser beams of 476.1 nm, 488 nm, 514.7 nm, 521 nm, 568 nm, 632.8 nm, 647.1 nm and 1 064 nm, vary from 400~1 100 nm, are chosen for the calibration experiments. The results indicate that the absolute spectral responsivity uncertainty is better than 0.02% in visible light wave band, and 0.03% at 1 064 nm.
史学舜, 陈坤峰, 王恒飞, 孙权社. 硅陷阱探测器绝对光谱响应率校准实验研究[J]. 光学与光电技术, 2009, 7(5): 63. SHI Xue-shun, CHEN Kun-feng, WANG Heng-fei, SUN Quan-she. Experimental Studies on Si Trap Detector Absolute Spectral Responsivity Calibration[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2009, 7(5): 63.