Chinese Optics Letters, 2010, 8 (s1): 108, Published Online: May. 14, 2010  

Options for polarization of probe beam in photothermal detuning technique Download: 644次

Author Affiliations
1 College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
2 Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China
3 Department of Physics, Nanchang University, Nanchang, Jiangxi 330031, China
Abstract
An explicit model from the matrix method is utilized to describe the measurement sensitivity of the photothermal detuning technique dependent on the polarization of the probe beam. Numerical results show that the optimal probe wavelengths and the slope of the main spectral band edges are different for both s- and p-polarized beams with the same incident angle. Compared with the random polarized probe beam at the larger incident angle, the measurement sensitivity can be improved approximately twice over with the p- and s-polarized probe beams under the optimal condition.

Honggang Hao, Bincheng Li, Wenliang Wang, Bo Yin. Options for polarization of probe beam in photothermal detuning technique[J]. Chinese Optics Letters, 2010, 8(s1): 108.

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