喇曼–原子力显微镜(Raman–AFM)是一种基于探针增强喇曼散射效应(TERS)的新型形貌表征与光电测试设 备，能够在纳米尺度上对低维结构材料与器件进行喇曼研究。本文详细介绍了Raman–AFM的基本原理与关键技术特点，并展望了它的发展前景。

Raman-atomic force microscopy (Raman-AFM) is a new morphology characterization and optoelectronic measurement instrument based on the Tip-enhanced Raman Scattering Effect (TERS). It can be used to perform Raman investigation on the low-dimensional structure materials and devices to the nano scale. In this paper, the fundamental principle and key techniques of the Raman-AFM are presented in detail and the prospects of the Raman-AFM are given.