针对现有波长检测技术的不足，提出一种采用阵列波导光栅(AWG)进行波长快速检测的方法，该方法利用AWG对波长信号进行空间分离，将波长信号转化为光场强度信号，利用传统的光场强度检测手段实现波长检测。给出了分析这种检测方法光学特性的数学模型，应用此模型，分析了AWG性能参数对波长检测性能的影响。分析表明：待检测的波长信号可以通过AWG相邻通道的功率比的对数值进行线性表达；减小AWG通道波长间隔或其半波全宽(3 dB带宽)可以提高波长检测灵敏度；此方法对AWG的通道不平坦度不敏感；通过对AWG进行±0.1 ℃的温度控制，此方法可以达到±0.005 nm的波长检测精度。

A new method of wavelength detection that employ an arrayed waveguide grating (AWG) is proposed, and its operating features are investigated in details. Wavelength detection can be easily achieved by using traditional means of detecting light intensity of AWGs output by this method. An explicit formula based on the Gaussian approximation is given and used to model the characteristics of this method. The results show that the wavelength signal to be detected can be linearly described by the logarithm of adjacent channels power ratio. The wavelength detection sensitivity can be improved by decreasing channel spacing or the full-width at half maximums(FWHM) bandwidths of AWGs channels. This method is not sensitive to the insertion loss ripple of AWG. The detection accuracy of ± 0.005 nm can be obtained by controlling the working temperature of AWG at the accuracy of ± 0.1 ℃ theoretically.