鉴于通常制作的离子阻挡膜存在通孔，在阴极低电压下，经MCP电子倍增在荧光屏上显示为亮孔，为测试出规则与不规则亮孔的大小和数量，提出了一种像管的离子阻挡膜质量测试方法。该方法是在规定电压和光阴极照度的条件下，使像管光阴极接收约2lx的光照射，给像管各极施加电压使像管荧光屏上离子阻挡膜亮孔清晰可见，用10倍显微镜或相机拍照，观察荧光屏所成的离子阻挡膜通孔图像。试验结果表明：在相同的测试条件下，离子阻挡膜的制作工艺不同，离子阻挡膜质量亦不同。

Since there are through-holes on the ion barrier film prepared with the normal technique, a method to measure the quality of ion barrier film is put forward to test the quantity and size of the regular or irregular apertures which cause the bright apertures on the screen by MCP electron multiplication when the low voltage is supplied to the cathode. Under the condition of assigned voltage and illumination of cathode, about 2lx light is illuminated on the photocathode, the voltage is exerted on each pole of the image intensifier to make the bright apertures on the screen to be seen distinctly, and then 10× microscope or camera is used to take pictures of the through-holes on the ion barrier film, which images on the screen. The experiment results show that under the same condition of testing, the quality of the ion barrier film is different if the craftwork of facture is different.