介绍了荧光寿命的测试原理。设计了荧光寿命测试系统。利用脉冲取样技术测试了Nd∶GGG晶体的荧光寿命，约为250μs。采用英国的荧光光谱仪，在室温条件下，用波长为488nm的Ar离子激光器激发Nd∶GGG晶体，获得了Nd：GGG晶体的荧光光谱，计算出的Nd∶GGG晶体的受激发射截面σ(λ)为21.57×10^－20cm²。

The fluorescence lifetime testing principle is introduced,and testing system is designed. The Nd∶GGG crystal fluorescence lifetime was measured to be 250μs by pulse sampling techniques. Fluorescence spectrum of Nd∶GGG crystal was obtained under excitation with the 488 nm argon ion laser at room temperature with British fluorescence spectrometer,and the stimulated-emission cross-section is calculated to be 21.57×10^－20 cm².