应用光学, 2006, 27 (1): 0079, 网络出版: 2010-06-13  

高精度偏振依赖损耗自动测试系统

High precision automatic test systems for polarization-dependent loss
作者单位
中国电子科技集团公司 第41研究所,山东 青岛 266555
摘要
光学器件的偏振依赖损耗(PDL)是发展光纤通信必须克服的关键技术之一。该文介绍了一种新型的高精度偏振依赖损耗自动测试系统,系统中采用耦合器和监测功率计,实现了单次接入即可完成偏振依赖损耗的测量,消除了系统光功率稳定性对测试结果的影响。在同一系统中,可实现多种方法测试偏振依赖损耗,采用偏振控制器的延迟补偿技术实现了全波段内的偏振依赖损耗高精度测试。系统工作波长范围为1200~1600 nm,偏振依赖损耗测量范围0~5 dB,测量不确定度高达0.005dB+PDL×4%,可满足各种光学器件偏振依赖损耗测试需要。
Abstract
Polarization-dependent loss (PDL) of optical components is one of the key problems that must be solved to develop the fiber communication. A novel high precision automatic test system for polarization-dependent loss is introduced in this paper. A coupler and optical power meter are employed in the system to realize the measurement of the polarization-dependent loss with a single connection,which can eliminate the effect of system power stability on the test result. In the same system,the measurement for the polarization-dependent loss can be carried out with several methods. With the delay compensation technology of polarization controller,high precision polarization-dependent loss test could be made in all the wave band. Since the wavelength range of the system is 1 200~1 600 nm,the measurement range of the polarizationdependent loss is 0~5 dB and the measurement uncertainty is up to 0.005 dB+PDL×4%,the system can meet the measuring requirement for polarization-dependent loss of every optical component.

王恒飞, 应承平, 全治科. 高精度偏振依赖损耗自动测试系统[J]. 应用光学, 2006, 27(1): 0079. WANG Heng-fei, YING Cheng-ping, QUAN Zhi-ke. High precision automatic test systems for polarization-dependent loss[J]. Journal of Applied Optics, 2006, 27(1): 0079.

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