点探测器的位置是决定双轴共焦显微技术层析能力的关键因素之一,理想的共焦显微成像系统要求点探测器放在光轴上并且没有离焦情况出现。通过理论和实验分析了点探测器偏离理想位置对双轴共焦显微技术的轴向响应特性造成的影响。结果表明,点探测器的微小轴向偏移对轴向响应特性造成的影响基本可以忽略,但点探测器的微小横向偏移会使轴向响应曲线沿着z轴方向产生一定的移动,移动量随着偏移量的增大而增大。

The position of the point detector is one of the important parameters for the optical sectioning of the dual-axes confocal microscopy,so the point detector should be correctly positioned on the axis and without defocus. The effect of the point detector position in dual-axes confocal microscopy is analyzed. The results show that the slight axial offset of the point detector brings few effects on the axial intensity response,and a slight transverse offset of the point detector can introduce a shift into the axial response curve,while the main lobe of the axial response curve in shape is almost invariant,and the shift in the axis z increases as the offset increases.