物质材料例如涂层、金属、电介质等有其各自的偏振特性。Stokes参量或是Mueller矩阵表示了偏振量化信息与材料 性质的关系。介绍了Mueller矩阵测量方法, 使用He-Ne ( nm)激光器经起偏器产生的偏振光照射在铝样品上,并经偏振分析光学系统,获取样 品Mueller矩阵元素测量图像数据。在给出 延迟器校正结果的前提下,使用64个偏振测量图像,并采用最小二乘法减小误差,给出了铝板样品的偏 振反射Mueller矩阵,比较分析了水平/垂直、 和左旋/右旋圆偏振分量随样品转角变化时的退偏特性曲线。结果表明,铝板的圆偏光与线偏光的退偏度 显著,为使用圆偏振实现探测提供可能性。

The polarization characteristics of light scattered by several materials such as paint, metal, dielectric layers are significant. The Stokes-Mueller formalism is used to study the depolarizing properties of sample. The Mueller matrix measurement is introduced. The polarized light from a He-Ne laser ( nm) is used, which is focused onto the surface of the sample, passed through the polarization-analysis optics onto a CCD camera. The retardation plates are submitted to a calibration procedure, 64 images are digitized and a generalized linear least square fit is calculated. The horizontal or vertical polarization, linear 45 or 135 polarization, and right or left circular polarization are compared and analyzed. The results show that for alumiunum plate, circular states have greater depolarization than linear states.