高分辨率光电探测相机探测能力的提高受杂散光的限制, 杂散光在很大程度上决定了探测能力的底限。由于光学系统的杂散光受到诸多因素影响, 必须在最终指标上进行测试, 如: 点源透射率(PST), 用于全系统性能指标控制。利用星模拟器超大动态范围的光辐射输出, 设计了一台光学系统杂散光PST测试设备, 解决了单个探测器动态范围无法覆盖108的问题; 在一定信噪比下, 分析了电子倍增CCD杂散光PST测试能力。经分析杂散光PST测试范围可达到10-2～10-8, 满足高分辨率光电探测相机杂散光测试的要求。

The detection ability of high resolution photoelectric detection system, to a great extent, is limited by the stray light. Since various factors influence stray light of optical system, its stray light must be tested in order to control the final indicators, such as point source transmittance (PST). On the base of star-simulator with huge dynamic range, the stray light test facility is designed, and the problem that dynamic range of single detector cannot cover 108 is solved. Under a reasonable signal-to-noise ratio, the test range of stray light PST with electron-multiplying CCD (EMCCD) is analyzed. Through analysis, the range of the stray light PST can reach 10-2～10-8, and meet the requirement for testing high resolution photoelectric detection system's PST.