光通信研究, 2007 (6): 43, 网络出版: 2011-03-07  

四象限InGaAs APD探测器的研究

Research on four-quadrant InGaAs APD photodetector
作者单位
重庆邮电大学 光电工程学院,重庆 400065
摘要
文章中设计的四象限InGaAs雪崩光电二极管(Avalanche Photo Diode ,APD)的管芯结构采用正入光式平面型结构,而材料结构采用吸收区、倍增区渐变分离的APD结构,在对响应时间、暗电流和响应度等参数进行计算与分析的基础上,优化了器件结构参数。试验结果表明,其响应时间≤1.5 ns,响应度≥9.5 A/W,暗电流≤40 nA,可靠性设计时使PN结和倍增层均在器件表面以下,可有效抑制器件表面漏电流,提高器件的可靠性。
Abstract
The chip of the four-quadrant InGaAs APD in this paper is designed in a frontal incident planar structure and its material part is an SAGM APD. On the basis of systematical analysis and calculation of its important parameters, such as response time, dark current and responsivity, the optimized structural and the technological parameters are given. The test results show that its response time is ≤1.5 ns, responsivity ≥9.5 A/W and dark current ≤40 nA. As the PN junction and multiplication layer are set under the surface of the device in the reliability design, the surface leakage current can be effectively restrained and the reliability of the device improved.

王致远, 李发明, 刘方楠. 四象限InGaAs APD探测器的研究[J]. 光通信研究, 2007, 33(6): 43. Wang Zhiyuan, Li Faming, Liu Fangnan. Research on four-quadrant InGaAs APD photodetector[J]. Study On Optical Communications, 2007, 33(6): 43.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!