为了研究电介质随机表面散射特性的物理产生机制，采用基于Kirchhoff近似的Monte-Carlo方法进行了数值计算，得到了一组不同粗糙程度的电介质随机表面在s线偏振光入射时的散射光强度空间分布。所有表面自相关长度相同。结果表明,随均方根高度的增加,散射光强度空间分布呈现峰值衰减、展宽和向后向移动的特征。对这些散射特征进行分析可知，这些散射特征产生的主要因素是本地面元的斜率分布和本地反射率，它们共同影响了散射光强度分布曲线的轮廓特征。这一结果对其它情形下的粗糙表面散射特征产生机制的研究有一定参考价值。

In order to study the generation mechanism of scattering characteristics of dielectric random surfaces, on the basis of Kirchhoff approximation, light intensity scattered from rough dielectric surfaces was calculated by means of Monte-Carlo method. The geometric profile of rough surfaces obeys Gaussian distribution. All of the surfaces have the same correlation length. With the increase of rms height, the distribution of the scattered intensity is broadened, decreased at its peak value and moved backward. The above phenomena were induced by the combination of the local slope and the reflecting index of local slope. This result provides reference to the research under more complex conditions.Key words: