红外, 2011, 32 (5): 14, 网络出版: 2011-05-26
氧化钒薄膜光伏效应机理分析
Analysis of Photovoltaic Mechanism of Oxide Vanadium Thin Film
氧化钒薄膜 退火 光伏效应 Dember效应 场制表面电压 oxide vanadium thin film annealing photovoltaic effect Dember effect electric field induced surface voltage
摘要
氧化钒薄膜是非致冷红外焦平面探测器的重要组成部分, 光电特性一直是国内外的研 究热点。用反应磁控溅射方法在K9玻璃衬底上制备了氧化钒薄膜, 并在特定条件下对其进行了退火处理。结果发现, 在300 ℃下 退火180 s的氧化钒薄膜在可见光照射情况下呈现出了光伏效应, 这说明光生载流子在氧化钒薄膜表层形成后得到了有效分 离。该光伏特性为氧化钒薄膜在光电探测器中的应用拓展提供了有力的理论依据。
Abstract
Oxide vanadium thin film is an important part of an uncooled infrared focal plane detector. Its photoelectric properties are studied extensively at home and abroad. Several oxide vanadium thin films are fabricated on K9 glass substrates by using a reactive magnetron sputtering method and are annealed under a particular condition. It is found that the oxide vanadium thin film annealed at 300 ℃ exhibits the photovoltaic effect when it is illuminated by visible light. This should be attributed to the effective separation of the photo-induced carriers after the oxide vanadium thin film is formed. This photovoltaic property reveals the potential applications of oxide vanadium thin films in photoelectric detectors.
卢小铃, 王涛, 李贺, 董翔, 顾德恩, 蒋亚东. 氧化钒薄膜光伏效应机理分析[J]. 红外, 2011, 32(5): 14. LU Xiao-ling, WANG Tao, LI He, DONG Xiang, GU De-en, JIANG Ya-dong. Analysis of Photovoltaic Mechanism of Oxide Vanadium Thin Film[J]. INFRARED, 2011, 32(5): 14.